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An 8-page, 4-color catalog from Fischer Technology describes the features of the Fischerscope(R) X-ray coating thickness measurement instruments. The literature explains the principle behind the X-ray fluorescence measurement. Features and specifications for each model type are included, along with information about the company's WinFTM(R) software. Using energy-dispersive X-ray fluorescence and the fundamental parameters method, the company says that its instruments can measure single, multi-layer, and alloy coatings as well as perform composition analysis, all standards free. With the software, the company says that up to 24 specimen parameters can be evaluated.
Fischer Technology |
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